CARTESIAN GEOMETRY ENERGY DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER
Rigaku NEX CG delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — with minimal standards.
Cartesian geometry for trace level sensitivity
Unlike conventional EDXRF analyzers, the NEX CG was engineered with a unique close-coupled Cartesian Geometry (CG) optical kernel that dramatically increases signal-to-noise. Monochromatic or polarized excitation from secondary targets, instead of conventional “noisy” white radiation (Bremsstrahlung) direct excitation, vastly improves detection limits for elements in highly scattering matrices like water, hydrocarbons, and biological materials. The resulting dramatic reduction in background noise, and simultaneous increase in element peaks, affords a spectrometer capable of routine trace element analysis even in difficult sample types.
Highest sensitivity for broad flexibility
As a multi-purpose, high-performance EDXRF spectrometer, the Rigaku NEX CG delivers routine elemental measurements across a diverse range of matrices — from homogeneous, low viscosity liquids to solids, metals, slurries, powders, pastes and thin films.
Novel software reduces the need for standards
NEX CG is powered by a new qualitative and quantitative analytical software, RPF-SQX, that features Rigaku Profile Fitting (RPF) technology. The software allows semi-quantitative analysis of almost all sample types without standards — and rigorous quantitative analysis with standards. Rigaku NEX CG software was developed to be both extraordinarily powerful and extremely easy to use. Ideal for non-technical operators, routine analyses are performed through a simplified customizable EZ Analysis interface.
- Analyze from sodium (₁₁Na) through uranium (₉₂U)
- Non-destructive elemental analysis
- Quantify solids, slurries, liquids, powders and coatings
- Polarized excitation delivers lower detection limits
- High resolution silicon drift detector (SDD)
- Analysis in air, helium or vacuum
- RPF-SQX for semi-quantitative analysis without standards
- Semi-empirical calibrations require very few standards
- Advanced novel treatment of peak overlap reduces errors
- EZ Analysis interface for routine operation
- Standard 15-position automatic sampler
|Product name||NEX CG|
|Technique||X-ray fluorescence (XRF)|
|Benefit||Elemental analysis of solids, liquids, powders, alloys and thin films|
|Technology||Cartesian geometry energy dispersive XRF (EDXRF) using SDD detector|
|Core attributes||50 W, 50 kV X-ray tube, SDD detector, analyze Na to U, autosampler, He-flush|
|Core options||Vacuum, sample trays, sample spinner, UPS, printer|
|Computer||External PC, MS Windows® OS , QuantEZ software|
|Core dimensions||600 (W) x 400 (H) x 600 (D) mm|
|Mass||Approx. 80 kg (core unit)|
|Power requirements||1Ø, 100/220 VAC 50/60 Hz, 15/7 A|