MSCL-XRF:
X-RAY FLUORESCENCE (XRF) SPECTROSCOPY
AND MULTI-SENSOR CORE LOGGING
Geotek offers a range of specialised core scanning/logging equipment that use XRF spectrometers to acquire elemental abundance from the surface of sediment and rock cores. The ability to continuously scan core samples using both petrophysical and spectroscopic techniques is a product unique to Geotek. XRF spectrometers can now be integrated into new or existing MSCL systems.
An MSCL is the perfect platform to acquire XRF data as it offers a stable and repeatable measurement geometry with each measurement depth co-registered with other spectroscopy and petrophysical sensors. Geotek offers two XRF spectrometers: the high resolution and ultra-sensitive Geotek XRF, and the popular hand-held Olympus Vanta. These are compatible with a range of different MSCL systems including: the standard MSCL-S, the small footprint MSCL-XZ, and the multiple core/core box workstation MSCL-XYZ.
APPLICATIONS OF XRF DATA
Nearly any geological, geochemical, or petrophysical application benefits from the ability to maximise data recovery from core material. Geotek’s MSCL systems achieve this by uniquely combining continuous downcore XRF with other spectroscopy and petrophysical measurements.
OIL & GAS/UNCONVENTIONAL
- Corroboration of downhole log elemental concentration
- Core to log integration and correlation
- Interpretation of mineralogy and matrix properties
- Linking core gamma ray with elemental content and density
MINING
- Identification of trace metals and ore identification
- Elemental abundances automatically stored and exported as ascii file
- Depth co-registration of elemental data with physical and magnetic properties for resource assessment
GEOHAZARD
- Sediment provenance assessment
- Bed/unit correlation
- Characterisation of cement
- Derivation or proxy for mineral distribution
- Mass movement identification
RESEARCH
- Elemental abundances used as a proxy for environmental change
- Identification of volcanic ash, or ice-rafted debris
- Characterisation of palaeosols and sediment/rock core samples
- 100 µm downcore logging resolution for high resolution climate change studies
ENVIRONMENTAL
- Identification of heavy metals
- Can be integrated with ultraviolet linescan imaging for hydrocarbon identification
- Field-based measurements
HIGH PERFORMANCE GEOTEK XRF SPECTROMETER
The ultra-sensitive Geotek X-ray fluorescence (XRF) spectrometer acquires precise elemental abundances from the surface of sediment and rock cores, and offers superior sensitivity for light elements.
- High performance large area silicon drift detector (SDD) with a helium-flushed measurement cell dramatically improves sensitivity, especially for the light elements such as Mg, Al, and Si
- Widest range of elements from Mg to U at ppm levels
- Motorised X-ray slits enable a downcore spatial resolution of 100 µm or less
- Sophisticated filter slide to lower detection limits across a wide range of elements, and allows different cross-core areas to be illuminated – perfect for high-resolution studies of dipping laminae
- Low power sealed X-ray source for long life (>10,000 hours) with no maintenance
- A unique close-coupled geometry for high efficiency at lower X-ray tube power
- Simple to use custom-designed software automatically communicates with the logger to acquire, interpret, and display the fluorescence spectra with element abundance during acquisition
- Precise measurements are assured through a combination of peak fit and deconvolution algorithms with a proprietary quantitative analysis suite
GEOTEK XRF SENSOR SPECIFICATIONS
- X-RAY SOURCE
15W/50kV, Rh anode allowing sulphur detection, air-cooled - X-RAY DETECTOR
Canberra Silicon Drift Detector, 15mm2 or 80mm2, FWHM: ~160eV Mn Kα - SPECTRAL ANALYSIS
bAxil - ELEMENTS DETECTED
Mg to U - DOWNCORE RESOLUTION
0.1 to 10 mm - CROSSCORE SLIT WIDTH
5, 10, or 15 mm
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